منابع مشابه
Atom probe tomography in nanoelectronics
The role of laser assisted atom probe tomography (APT) in microelectronics is discussed on the basis of various illustrations related to SiGe epitaxial layers, bipolar transistors or MOS nano-devices including gate all around (GAA) devices that were carried out at the Groupe de Physique des Matériaux of Rouen (France). 3D maps as provided by APT reveal the atomic-scale distribution of dopants a...
متن کاملOn Second Atom-Bond Connectivity Index
The atom-bond connectivity index of graph is a topological index proposed by Estrada et al. as ABC (G) uvE (G ) (du dv 2) / dudv , where the summation goes over all edges of G, du and dv are the degrees of the terminal vertices u and v of edge uv. In the present paper, some upper bounds for the second type of atom-bond connectivity index are computed.
متن کاملAtom Probe Tomography of Oxide Scales
Atom probe tomography, APT, is the only microstructural method that can routinely analyse and position individual atoms in a material with a spatial resolution of 0.1-0.5 nm. Recent implementation of pulsed-laser to APT made investigation of less conducting materials, such as oxides, feasible. In this paper a short description of the principle of the techniques is presented. It is followed by e...
متن کاملDynamic reconstruction for atom probe tomography.
Progress in the reconstruction for atom probe tomography has been limited since the first implementation of the protocol proposed by Bas et al. in 1995. This approach and those subsequently developed assume that the geometric parameters used to build the three-dimensional atom map are constant over the course of an analysis. Here, we test this assumption within the analyses of low-alloyed mater...
متن کاملAtom-Probe Tomography of Meteoritic Nanodiamonds
1 Robert A. Pritzker Center for Meteoritics and Polar Studies, The Field Museum of Natural History, Chicago, IL, USA. E-mail: [email protected] 2 Chicago Center for Cosmochemistry, The University of Chicago, Chicago, IL, USA. 3 Northwestern University Center for Atom-Probe Tomography, Department of Materials Science & Engineering, Northwestern University, Evanston, IL, USA. 4 Materials Sci...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2010
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927610055704